Products > Software > EDA > Design for Test > Memory Test > MBISTArchitect

 

MBISTArchitect

Features

 

• On-chip testing for embedded memories
• Generates and inserts BIST for a wide variety of embedded memory arrays
• Extensive test algorithms including capabilities to create custom algorithms
• True at-speed test for highest test quality
• Facilitates the diagnosis and repair process
• Creates a simulation testbench for verification
• Provides online algorithm selection

 

Benefits

 

• Delivers the fastest "at-speed" testing for efficient, high quality test
• Enables customized algorithms for maximum flexibility and test coverage
• Offers comprehensive diagnostics for failure analysis
• Supports memory repair for yield improvement
• On-line algorithm selection enables users to choose which tests should be executed during manufacturing, allowing for balance between test time and increased coverage during production

 

Click for MBIST Architect Datasheet (PDF)